Additional Features:

• Optical spectrum analyzer with low polarization dependence for optical amplifiers
• Power measurement
• Pulse light measurement

Spectral values

• Wavelength: 550 to 1750 nm
• Resolution (half-value width): 0.1 to 5 nm, 1/2/5 steps
• Measurement accuracy: ±0.2 nm
• Measurement principle: polarization-compensated double pass monochromator
• Span: 1 to 1200 nm, 0 nm

Level

• Sensitivity: 1200 to 1650 nm -92 dBm; 550 to 1750 nm -55 dBm
• Max. input level: +20 dBm
• Measurement accuracy: ±0.4 dB
• Polarization dependence: ±0.05 dB
• Linearity: ±0.05 dB/-10 to -50 dBm
• Dynamic range: 55 dB at ±0.5 nm; 65 dB at ±1 nm
• Scale: 0.2 to 10 dB/division, 1/2/5 steps, linear
• Pulse light: in pulse mode or with external trigger, pulse >10 ns; Max Hold mode

Processing

• Measurement time: 0.8 second for 200 nm span
• Memory: 32 curves, 10 instrument setups, 3 ½" disk drive
• Analysis of amplifiers (EDFA): noise figure, spontaneous emission, power, gain; X dB bandwidth, peak wavelength, etc.

Interfaces

• Optical connector: FC without contact in fiber
• Remote control: IEC625 (IEEE488)
• Printer: built-in printer (standard) or output to plotter via IEC/IEEE bus

General data

• Power supply: 90 to 250 V, 48/66 Hz, 180 VA
• Dimensions (W x H x D); weight: 424 mm x 221 mm x 450 mm; 29 kg