4156B HP Semiconductor Parameter Analyzer
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V
Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
Time-domain measurement: 60µs–variable intervals, up to 10,001 points
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4156B HP Semiconductor Parameter Analyzer
Detail
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V
Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
Time-domain measurement: 60µs–variable intervals, up to 10,001 points
Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
Automation: built-in HP Instrument BASIC, trigger I/O capability
Set measurement and/or stress conditions
Control measurement and/or stress execution
Perform arithmetic calculations
Display measured and calculated results on the LCD display
Perform graphical analysis
Store and recall measurement setups, and measurement and graphical display data
Dump to printers or plotters for hardcopy output
Perform measurement and analysis with the built-in HP Instrument BASIC
Self test, Auto calibration
Option
Option |
Description |
HRSMU |
+-100V max |
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