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4156B HP Semiconductor Parameter Analyzer
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60µs–variable intervals, up to 10,001 points
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4156B HP Semiconductor Parameter Analyzer
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Detail
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60µs–variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability Set measurement and/or stress conditions Control measurement and/or stress execution Perform arithmetic calculations Display measured and calculated results on the LCD display Perform graphical analysis Store and recall measurement setups, and measurement and graphical display data Dump to printers or plotters for hardcopy output Perform measurement and analysis with the built-in HP Instrument BASIC Self test, Auto calibration 
Option
Option Description
HRSMU +-100V max
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