Additional Features: High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1 µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60 µS variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability The Agilent HP 4156A is the next generation in precision semiconductor parameter analyzers. You get the best digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument. This new family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis. The Agilent HP 4156A offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The Agilent HP 4156A extends current resolution to 1 fA and accuracy to 20 fA. The Agilent HP 4156A utilizes full-kelvin remote sensing on each SMU. At any time, you can add the Agilent HP 41501A SMU and Pulse Generator Expander, which is supplied with a 0 V/1.6 A Ground Unit. The expander accepts two 100 mA/100 V SMUs or one 1 A/200 V SMU, and two specially- synchronized 40 V/200 mA/1 μs pulse generators. Setup and measurement are made by setting up pages and filling in the blanks from front-panel keys, keyboard, or HP-IB (SCPI commands). You can also instantly measure and find setup conditions by using knob sweep capability, which is similar to curve tracer operation.