High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1 µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60 µS variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability The Agilent HP 4156A is the next generation in precision semiconductor parameter analyzers. You get the best digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument. This new family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.

Option	Description
402
HRSMU	+-100V max