Additional Features: High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1μV to 200 VF Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUsSS Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60μs–variable intervals, up to 10,001 pointsE Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability The Agilent 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete DC characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo) on a built-in CRT display.