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4155A HP Semiconductor Parameter Analyzer
I: 1 fA to 100 mA (20 fA offset accuracy) V: 1 micro V to 100 V Fully automated I-V sweep measurements with DC or Pulse Mode expandable up to 6 SMUs Synchronized stress/measure function Two high-voltage pulse generator units (+/- 40 V)
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4155A HP Semiconductor Parameter Analyzer
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 I: 1 fA to 100 mA (20 fA offset accuracy) V: 1 micro V to 100 V Fully automated I-V sweep measurements with DC or Pulse Mode expandable up to 6 SMUs Synchronized stress/measure function Two high-voltage pulse generator units (+/- 40 V) Time domain measurement: 60 micro s - variable intervals up to 10,001 points Easy to use knob-sweep similar to curve tracer Automatic analysis functions Built-in Agilent / HP Instrument BASIC Trigger I/Q capability 
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