Additional Features: High-resolution DC Parametric Measurements With the 370B (Resolution Down to 1 pA or 2 µV) High Voltage and Current Sourcing With the 371B (Up to 3,000 V or 400 A) Built-in Cursor Measurements - Dot, Window and Function Line Kelvin Sense Measurements Sweep Measurement Mode Waveform Comparison and Averaging Fully Programmable 1.44 MB Floppy Drive Stores Setup and Bitmap of Curves Direct Hardcopy with Third-party Printer Parametric Characterization of Semiconductors Failure Analysis Data Sheet Generation Manufacturing Test Process Monitoring and Quality Control Incoming Inspection Component Matching The Tektronix 370B provides up to 20 A/2,000 V sourcing capability combined with 1 pA and 50 micro V measurement resolution. The 370B performs DC parametric characterization of integrated circuits, transistors, thyristors, diodes, SCRs, MOSFETs, electro-optic components, solar cells, solid-state relays and other semiconductor devices. It has push button source and measurement configuration so it's easy to change from one test to the next.