Features: Simplifies laser diode LIV testing prior to packaging or active temperature control Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level Sweep can be programmed to stop on optical power limit Combines high accuracy source and measure capabilities for pulsed and DC testing Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements Programmable pulse on time from 500ns to 5ms up to 4% duty cycle Pulse capability up to 5A, DC capability up to 1A 14-bit measurement accuracy on three measurement channels (VF , front photodiode, back photodiode) Measurement algorithm increases the pulse measure ment’s signal-tonoise ratio Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput Digital I/O binning and handling operations IEEE-488 and RS-232 interfaces Accessories: User’s Manual Quick Reference Guide Triax Cables (2) BNC 10? Coaxial Cables (4) Applications: Telecommunication laser diodes Optical storage read/write head laser diodes Vertical Cavity Surface-EmittingLasers (VCSELs) Thermal impedance Junction temperature response Specifications: Operating: 0°–50°C, 70% R.H. up to 35°C. Derate 3% R.H./°C, 35°–50°C. Storage: –25° to 65°C. The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-currentvoltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.