| 021 |
Add pulse modulator to internal 1st source |
| 022 |
Add pulse modulator to internal 2nd source |
| 090 |
Spectrum analysis hardware, 9 kHz to 4.5 GHz |
| 091 |
Spectrum analysis hardware, 9 kHz to 6.5 GHz |
| 092 |
Spectrum analysis hardware, 9 kHz to 9 GHz |
| 093 |
Spectrum analysis hardware, 9 kHz to 14 GHz |
| 094 |
Spectrum analysis hardware, 9 kHz to 20 GHz |
| 095 |
Spectrum analysis hardware, 100 kHz to 26.5 GHz |
| 096 |
Spectrum analysis hardware, 100 kHz to 32 GHz |
| 097 |
Spectrum analysis hardware, 100 kHz to 44 GHz |
| 098 |
Spectrum analysis hardware, 100 kHz to 53 GHz |
| 120 |
Add internal bias tees for 2-port E5080B up to 20 GHz |
| 140 |
Add internal bias tees for 4-port E5080B up to 20 GHz |
| 172 |
Add GPIB interface |
| 175 |
Add analog input and output |
| 181 |
Keyboard |
| 182 |
Mouse |
| 1A7 |
Calibration + Uncertainties + Guardbanding |
| 1E5 |
Add high stability timebase |
| 1NC |
Equipped with type-N connectors |
| 240 |
2-port test set, 9 kHz to 4.5 GHz |
| 260 |
2-port test set, 9 kHz to 6.5 GHz |
| 290 |
2-port test set, 9 kHz to 9 GHz |
| 2D0 |
2-port test set, 9 kHz to 14 GHz |
| 2H0 |
2-port test set, 9 kHz to 18 GHz |
| 2K0 |
2-port test set, 9 kHz to 20 GHz |
| 2L0 |
2-port test set, 100 kHz to 26.5 GHz |
| 2M0 |
2-port test set, 100 kHz to 32 GHz |
| 2N0 |
2-port test set, 100 kHz to 44 GHz |
| 2P0 |
2-port test set, 100 kHz to 53 GHz |
| 440 |
4-port test set, 9 kHz to 4.5 GHz |
| 442 |
4-port test set, 9 kHz to 4.5 GHz with second source |
| 460 |
4-port test set, 9 kHz to 6.5 GHz |
| 462 |
4-port test set, 9 kHz to 6.5 GHz with second source |
| 490 |
4-port test set, 9 kHz to 9 GHz |
| 492 |
4-port test set, 9 kHz to 9 GHz with second source |
| 4D0 |
4-port test set, 9 kHz to 14 GHz |
| 4D2 |
4-port test set, 9 kHz to 14 GHz with second source |
| 4H0 |
4-port test set, 9 kHz to 18 GHz |
| 4H2 |
4-port test set, 9 kHz to 18 GHz with second source |
| 4K0 |
4-port test set, 9 kHz to 20 GHz |
| 4K2 |
4-port test set, 9 kHz to 20 GHz with second source |
| 4L0 |
4-port test set, 100 kHz to 26.5 GHz |
| 4L2 |
4-port test set, 100 kHz to 26.5 GHz with second source |
| 4M0 |
4-port test set, 100 kHz to 32 GHz |
| 4M2 |
4-port test set, 100 kHz to 32 GHz with second source |
| 4N0 |
4-port test set, 100 kHz to 44 GHz |
| 4N2 |
4-port test set, 100 kHz to 44 GHz with second source |
| 4P0 |
4-port test set, 100 kHz to 53 GHz |
| 4P2 |
4-port test set, 100 kHz to 53 GHz with second source |
| A6J |
ANSI Z540-1-1994 Calibration |
| S96007B |
Automatic fixture removal |
| S96010B |
Time domain analysis |
| S96011B |
Enhanced time domain analysis with TDR |
| S96015B |
Real-time S-Parameter and Power Measurement Uncertainty |
| S96025B |
Basic pulsed-RF measurements |
| S96029B |
Noise figure measurements with vector correction |
| S96082B |
Scalar mixer/converter measurements |
| S96083B |
Vector and scalar mixer/converter measurements |
| S96084B |
Embedded LO capability |
| S96086B |
Gain-compression measurements |
| S96088B |
Source phase control |
| S96089B |
Differential and I/Q devices measurements |
| S96090B |
Spectrum analysis |
| S96460B |
True-mode stimulus |
| S96552B |
Multiport calibration assistant |
