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4156B Agilent Semiconductor Parameter Analyzer
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60µs–variable intervals, up to 10,001 points
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4156B Agilent Semiconductor Parameter Analyzer
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Additional Features: High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60µs–variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability Set measurement and/or stress conditions Control measurement and/or stress execution Perform arithmetic calculations Display measured and calculated results on the LCD display Perform graphical analysis Store and recall measurement setups,
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HRSMU +-100V max
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