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4156B Agilent Semiconductor Parameter Analyzer
Additional Features: High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60µs–variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability Set measurement and/or stress conditions Control measurement and/or stress execution Perform arithmetic calculations Display measured and calculated results on the LCD display Perform graphical analysis Store and recall measurement setups, and measurement and graphical display data Dump to printers or plotters for hardcopy output Perform measurement and analysis with the built-in HP Instrument BASIC Self test, Auto calibration The Agilent HP 4156B offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The Agilent HP 4156B extends current resolution to 1 fA and accuracy to 20 fA. The HP 4156B utilizes full-kelvin remote sensing on each SMU. At any time, you can add the Agilent HP 4150 1B SMU and Pulse Generator Expander, which is supplied with a 0V/1.6 A Ground Unit. The expander accepts two 10 0 mA/100 VSMUs or one 1A/200V SMU, and two specially-synchronized 40V/200 mA/1 µs pulse generators. Setup and measurement are made by setting up pages and filling in the blanks from front-panel keys, keyboard, or GPIB (SCPI commands). You can also instantly measure and find setup conditions by using knob sweep capability, which is similar to curvetracer operation. Once you find the parameter extraction conditions, you can automatically get the parameter by using the automatic analysis function.
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4156B Agilent Semiconductor Parameter Analyzer
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Additional Features: High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) Time-domain measurement: 60µs–variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability Set measurement and/or stress conditions Control measurement and/or stress execution Perform arithmetic calculations Display measured and calculated results on the LCD display Perform graphical analysis Store and recall measurement setups, and measurement and graphical display data Dump to printers or plotters for hardcopy output Perform measurement and analysis with the built-in HP Instrument BASIC Self test, Auto calibration The Agilent HP 4156B offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The Agilent HP 4156B extends current resolution to 1 fA and accuracy to 20 fA. The HP 4156B utilizes full-kelvin remote sensing on each SMU. At any time, you can add the Agilent HP 4150 1B SMU and Pulse Generator Expander, which is supplied with a 0V/1.6 A Ground Unit. The expander accepts two 10 0 mA/100 VSMUs or one 1A/200V SMU, and two specially-synchronized 40V/200 mA/1 µs pulse generators. Setup and measurement are made by setting up pages and filling in the blanks from front-panel keys, keyboard, or GPIB (SCPI commands). You can also instantly measure and find setup conditions by using knob sweep capability, which is similar to curvetracer operation. Once you find the parameter extraction conditions, you can automatically get the parameter by using the automatic analysis function.
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HRSMU +-100V max
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