4156B Agilent Semiconductor Parameter Analyzer
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V
Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
Time-domain measurement: 60µs–variable intervals, up to 10,001 points
REQUEST A QUOTE
4156B Agilent Semiconductor Parameter Analyzer
Detail
Additional Features:
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V
Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
Time-domain measurement: 60µs–variable intervals, up to 10,001 points
Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
Automation: built-in HP Instrument BASIC, trigger I/O capability
Set measurement and/or stress conditions
Control measurement and/or stress execution
Perform arithmetic calculations
Display measured and calculated results on the LCD display
Perform graphical analysis
Store and recall measurement setups,
Option
Option |
Description |
HRSMU |
+-100V max |
Download
Video