Additional Features: DC to 70+ GHz Bandwidth Bandwidth is determined by plug-in modules and may exceed 70 GHz should higher speed modules become available in the future Modules sold separately Exceptional Trigger Jitter and Horizontal Timebase Stability Modular Architecture Up to Eight Channels Acquisition High Resolution and Measurement Repeatability Comprehensive, Accurate, Automatic Measurement System Intuitive User Interface: Large Display (10.4 in.); Microsoft Windows-based Graphical User Interface Windows 2000 for Enhanced Network Security Power Requirements Line Voltage and Frequency: 100 to 240 VAC ±10% 50/60 Hz.; 115 VAC ±10% 400 Hz. Applications Semiconductor Testing Impedance and Crosstalk Characterization (using TDR) High-speed Digital Data Communications The TDS8000B Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform-processing capabilities of any ultra-high bandwidth oscilloscope. With excellent measurement repeatability, exceptional vertical resolution and fast waveform acquisition and display update rates, the TDS8000B is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages, cables and high-speed digital communications. State-of-the-Art Waveform Acquisition The TDS8000 Series’ state-of-the-art timebase provides equivalent time sweep speeds from 1.0 ps/div to 5 ms/div with record lengths from 20 to 4000 points and a sample interval down to 10 fem to-seconds (0.01 ps). In addition, the 8000 Series Sampling Oscilloscopes’ timebases can be locked to a 10 MHz reference providing greater long-term stability. This capability also allows multiple TDS8000Bs to be synchronized to other test equipment and/or the device-under-test. The TDS8000B offers two magnification windows, whereby sections of the main trace are re-acquired at higher resolution for closer examination of details. The TDS8000B boasts the highest sample rate among sampling oscilloscopes. Its multi-processor architecture, with dedicated per channel digital signal processors (DSP), guarantees the highest waveform acquisition rates regardless of the number of channels acquired or waveform processing done. Modularity and Flexibility The TDS8000B supports a large and growing family of electrical and optical plug-in modules. This modular architecture lets you configure the instrument with the right features for your application both now and in the future. The electrical plug-ins include a variety of modules with typical bandwidths up to 70+ GHz and specialized features such as TDR for impedance and crosstalk characterizations. High bandwidth probes are also available for constructing a total acquisition solution. The available optical modules provide complete optical test solutions for both telecom (155 Mb/s to 43 Gb/s) and datacom (FibreChannel, InfiniBand and Gigabit Ethernet) applications as well as general-purpose optical signal testing. Unmatched TDR Capabilities With the 80E04 TDR Sampling Module, the TDS8000B offers unmatched TDR performance on up to eight channels simultaneously. Each channel has an independent polarity selectable step-generator offering unmatched 35 ps reflected rise time. The TDS8000B provides the only true differential TDR system available today. Automatic, transparent correction for variations in step amplitude and baseline offset guarantee accuracy and repeatability of impedance measurements. 8000 Series Sampling Oscilloscope Platform The TDS8000B is built on Tektronix’ sampling oscilloscope platform that combines familiar MS Windows-based PC technologies with world-class waveform acquisition technology. This platform provides a wide array of standard instrumentation and communications interfaces (such as GPIB, parallel printer port, RS-232-C and USB serial ports and an Ethernet LAN connection). In addition, the platform includes several mass storage devices (floppy disk, removable hard drive and CD-ROM). The TDS8000B is equipped with a large, full-color display that helps you discriminate waveform details. Color-grading of waveform data adds a third dimension – sample density – to your signal acquisitions and analysis. Gated triggering, a feature that allows the exclusion of selected time periods from being measured, is offered as an option. Because the system supports an open MS Windows environment, new levels of data analysis can be done directly on the instrument using commercially available software packages.  Additionally, TekVISATM, a standard software feature, allows the instrument to be placed under the control of software applications (e.g. LabView, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument, or on external PC workstations network connected to the instrument, without the need for a GPIB hardware interface. Plug and play drivers for LabView and other programs are also supplied. 8000 Series Sampling Oscilloscope Optical Modules 80C01 Multi-rate Telecom Sampling Module - The 80C01 module supports waveform conformance testing of long-wavelength (1100 to 1650 nm) signals at 622, 2488 Mb/s and 9.953 Gb/s as well as general-purpose testing with up to 20 GHz optical bandwidth. With its clock recovery option, the 80C01 provides testing solutions for 622 and 2488 Mb/s telecom applications. 80C02 High-performance Telecom Sampling Module - The 80C02 module is optimized for testing of long-wavelength (1100 to 1650 nm) signals at 9.953 Gb/s (SONET OC-192/SDH STM-64). With its high optical bandwidth of 30 GHz (typical), it is also well-suited for general-purpose high-performance optical component testing. The 80C02 can be optionally configured with clock recovery that supports 9.953 Gb/s telecom standards. 80C07B Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C07B module is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module optimized for testing datacom/telecom signals from 155 to 2500 Mb/s. With its amplified O/E converter design, this module provides excellent signal-to-noise performance, allowing users to examine low-power optical signals. The 80C07B can be optionally configured with clock recovery that supports 155, 622, 1063, 1250, 2125, 2488, 2500 and 2666 Mb/s rates. 80C08C Multi-rate, Datacom & Telecom Optical Sampling Module with 10 GbE Forward Error Correction - The 80C08C module is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module providing datacom rate testing for 10GbE applications at 9.953, 10.3125, 11.0957 Gb/s and 10G Fibre Channel applications at 10.51875 Gb/s. The 80C08C also provides telecom rate testing at 9.953, 10.664, and 10.709 Gb/s. With its amplified O/E converter design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low-power level optical signals. The 80C08C can be optionally configured with clock recovery options that can support any standard or user defined rate in the continuous range from 9.8 to 12.6 Gb/s. 80C10 65 GHz 40 Gbps Optical Sampling Module with 43 Gbps ITU-T G.709 Forward Error Correction - The 80C10 module provides integrated and selectable reference receiver filtering, enabling conformance testing at either 1310 nm or 1550 nm for 39.813 Gbps (OC-768/STM-256) and 43.018 Gbps (43 Gbps ITU-T G.709 FEC) rates. In addition to the filter rates, the user may also choose selectable bandwidths of 30 GHz or 65 GHz for optimal noise vs. bandwidth performance for accurate signal characterization. 80C11 Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C11 module is a long wavelength (1100 to 1650 nm) multi-rate optical sampling module optimized for testing 10 Gb/s datacom and telecom standard rates at 9.953, 10.3125, 10.51875, 10.664, 10.709, and 11.0957 Gb/s. With its high optical bandwidth of up to 30 GHz (typical) it is well-suited for general purpose high-performance 10 Gb/s optical component testing. The 80C11 can be optionally configured with clock recovery options that can support any standard or user defined rate in the continuous range from 9.8 to 12.6 Gb/s. 80C12 Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C12 module is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module providing multi-rate telecom and datacom testing. This highly flexible module can be configured to support either lower data rate applications (1 to 4 Gb/s) or a wide variety of 10Gb/s applications. The low data rate applications include: 1, 2, and 4 Gb/s FibreChannel and “by 4” wavelength division multiplex standards such as 10GBase-X4 and 4-Lane 10 Gb/s FibreChannel. The supported 10Gb/s application includes both datacom and telecom application. The supported 10Gb/s datacom applications include 10GbE applications at 9.953, 10.3125, 11.0957 Gb/s and 10G Fibre Channel applications at 10.51875 Gb/s. The 80C12 also provides telecom rate testing at 9.953, 10.664, and 10.709 Gb/s. With its amplified O/E converter design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low-power level optical signals. Clock recovery for the 80C12 is provided via the 80A05 (sold separately). 8000 Series Sampling Oscilloscope Electrical Modules 80E01 Sampling Module - The 80E01 is a single-channel, 50 GHz bandwidth sampling module. The 80E01 has a measured bandwidth of 50 GHz or more and a calculated rise time of 7.0 ps or less. Displayed noise is typically 1.8 mVRMS. The front-panel connector is female 2.4 mm and an adapter is provided (2.4 mm male to 2.92 mm female) to maintain compatibility with SMA connector systems. 80E02 Low-noise Sampling Module - The 80E02 is a dual-channel, 12.5 GHz sampling module specifically designed for low-noise measurements in digital communications and device characterization applications. It provides an acquisition rise time of 28 ps and typically 400 μVRMS of displayed noise. The 80E02 is the ideal instrument for low-noise applications. Common applications for the 80E02 are capturing and displaying switching characteristics of high-speed communications circuits, making accurate statistical measurements of signal noise and signal timing jitter or obtaining stable timing measurements of fast digital ICs. 80E03 Sampling Module - The 80E03 is a dual-channel, 20 GHz sampling module. This sampling module provides an acquisition rise time of 17.5 ps. 80E04 TDR Sampling Module - The 80E04 is a dual-channel, 20 GHz sampling module with TDR capability. This sampling module provides an acquisition rise time of 17.5 ps, with a typical 20 GHz equivalent bandwidth. The TDR feature provides high resolution with true differential capability and fast 35 ps reflected rise time of the TDR slope. 80E06 70+ GHz Sampling Module - The 80E06 is a single channel, 70+ GHz (typical bandwidth) sampling module with 5.0 ps calculated rise time. Typical RMS noise is 1.8 mV. This sampling module provides a 1.85 mm (Type V) front-panel connector and a precision adapter to 2.92 mm with a 50 Ω termination. 1 meter or 2 meter length Extender Cables can be ordered for remote operation of the sampling module from the sampling oscilloscope mainframe. 80A05 Electrical Clock Recovery Module - The 80A05 enables clock recovery for electrical signals, as well as internal triggering on the recovered clock. The module recovers clocks from serial data streams for all of the most common electrical standards in the 50 Mb/s to 4.26 Gb/s range. Option 10G adds support for standard rates up to 12.6 Gb/s. The module accepts either single-ended or differential signals at its input, providing both single-ended and differential clock recovery. This module also serves as the clock recovery module for the 80C12.