Additional Features: Bandwidth: 500 MHz Channels: 4 Sample Rate: 5 Gs/s Equivalent Time Sample Rate (max): 250 GS/s Record Length: 400 kPts Display: Color >400,000 Wfms/second Maximum Waveform Capture Rate Graphical User Interface Control via Classic Direct Controls, Touch-sensitive Color Display or Mouse Navigation Open Microsoft Windows Environment Built-in Networking Applications Verification, debug and characterization of sophisticated designs Jitter and timing analysis Spectral analysis Disk drive analysis Investigation of transient phenomena The TDS7054 oscilloscopes are high performance solutions for verification, debug, and characterization of sophisticated electronic designs. Classic analog-style controls, a large touch-sensitive display and graphical menus provide intuitive control. Open access to the MS Windows operating system enables unprecedented customization and extensibility. Superior Performance TDS7000 models range from 500 MHz to 4 GHz bandwidth with single-shot sample rates to 20 GS/s, meeting demands of the latest high speed logic families and multi-Gigabit communication standards. Acquisition memory options from 2 to 32 Megasamples maximize the value of high sample rate and ensure that critical events are captured with fine detail. High performance jitter analysis to 1 psRMS is achieved through exceptional trigger and acquisition performance, deep memory and applied software. TDS7000 Series high bandwidth signal access solutions include the P7240 4 GHz (120 ps rise time) active probe and the P7330 3 GHz (< 130 ps rise time, typical, < 140 ps guaranteed) differential probe. Small form- factors and a wide array of tip accessories ensure effectiveness. In addition, the TDS7404 includes the TekConnect™ signal interconnect system. This interface replaces traditional BNC input connectors with a convenient positivelocking interface suitable for higher system bandwidths. P7000 Series probes are directly compatible with TekConnect signal interconnect system along with adapters that provide SMA, BNC and N connections. The image is a representation of selection. See specifications for product details.

Option	Description
1M	2 Msamples max, 500 ksamples/ch
2M	8 Msamples max, 2 Msamples/ch
3M	16 Msamples max, 4 Msamples/ch
4M	32 Msamples max, 8 Msamples/ch
J1	Jitter Analysis Software
J2	Disk Drive Analysis Software
JE3	Jitter Analysis - Essentials
JT3	TDSJIT3 Advanced Jitter Analysis application with random anTDSJIT3 Advanced Jitter Analysis application with random and deterministic jitter analysisd deterministic jitter analysis
USB	TDSUSBS-USB2.0 Compliance Test S/W Only