Additional Features: Bandwith: 6 GHz Number of Channels: 4  Record Length: 250k Sample Rate: 20 GS/s Max. Vertical Sensitivity: 1 V/div Min. Vertical Sensitivity: 10 mV/div Type (D/A) Digital Down to 70 ps Rise Time Jitter Measurements to 0.7 psRMS Compliance Mask Tests Supporting a Wide Range of Computer and Datacom Standards 32-Bit Serial Trigger for Isolation of Pattern dependent Effects Analysis and Networking Functionality MultiView Zoom for Rapid Navigation of the Record Control Via Classic Direct Controls, Touch-sensitive Color Display or Mouse Open Windows Environment Built-in Networking Applications: Validation and Characterization of High-speed Digital Designs Jitter and Timing Analysis Investigation of Transient Phenomena The TDS6604 oscilloscopes are high-performance solutions for verification, debug and characterization of sophisticated electronic designs. They feature exceptional signal acquisition performance, operational ease and open connectivity to the design environment. Classic analog-style controls, a large touch-sensitive display and graphical menus provide intuitive control. Open access to the Windows operating system enables unprecedented customization and extensibility. With a 6 GHz bandwidth and 20 GS/s sample rate on 2 channels or 10 GS/s sample rate on 4 channels simultaneously, the TDS6604 provides unmatched signal integrity measurements. High-performance jitter analysis down to 0.7 psRMS is achieved through exceptional trigger and acquisition performance and applied software.