Additional Features: Full vector network and spectrum measurements and analysis Wide dynamic range network measurement with fast sweep speeds ±0.05dB/±0.3° dynamic magnitude/phase accuracy Extremely fast narrow band spectrum measurement Network analysis from 100 kHz to 1.8 GHz, 1 MHz resolution Integrated source -60 to +20 dBm with 0.1 dB resolution Measurements include: attenuation, bandwidth, center frequency, complex impedance, gain/loss, phase, linearity, VSWR and more Spectrum analysis from 2 Hz to 1.8 GHz, 1 Hz to 3 MHz RBW Spectrum analyzer measurements include adjacent channel power, carrier-to-noise, flatness, frequency, harmonic distortion, phase noise, occupied bandwidth, sensitivity, and more Color CRT and built-in disk drive/RAM disk GPIB The Agilent 4396A provides excellent RF vector network and spectrum measurements for lab and production applications.  Gain, phase, group delay, distortion, spurious, CN, and noise measurements often required for evaluating components and circuits can be measured using one instrument.  When combined with a test set, the Agilent HP 4396A provides reflection measurements, such as return loss, and SWR, and S parameters. As a vector network analyzer, the Agilent 4396A operates from 100 kHz to 1.8 GHz with 1 MHz resolution and its integrated synthesized source provides -60 to +20dBm of output power with 0.1dB resolution.  The dynamic magnitude and phase accuracy are ±0.05 dB and ±0.3° so that it can accurately measure gain and group delay flatness, which are becoming more important in modern electronics systems. As a spectrum analyzer, the Agilent 4396A operates from 2 Hz to 1.8 GHz with resolution-bandwidths (RBWs) spanning 1 Hz to 3 MHz in a 1-3-10 sequence. A fully synthesized local oscillator allows stable and accurate frequency analysis. Direct A/D conversion (no LOG amplifier is used) results in +/-1.0 dB overall level accuracy. Noise sidebands fall below -105 dBc/Hz offset from carriers below 1 GHz, while sensitivity is -150 dBm/Hz at 10 MHz and -147 dBm at 1 GHz. In addition, with two network and spectrum (or transmission and reflection) characteristics of the device under test in split-screen format. For example, an amplifier's frequency response (network measurement) and distortion (spectrum measurement) can be shown at the same time.