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P7330 Tektronix Differential Probe
Additional Features: 3.5 GHz Bandwidth Applications: Communications (Gigabit Ethernet, Fibre Channel, InfiniBand) Semiconductor Characterization and Validation (PCI-Express, Serial ATA, IEEE 1394, USB 2.0, RAMBUS, DDR) Disk Drive Design Low Input Capacitance: > 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz Small Probe Head Allows Easy Probing of SMDs The Tektronix P7330 Differential Probes enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The Tektronix P7330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
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P7330 Tektronix Differential Probe
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Additional Features: 3.5 GHz Bandwidth Applications: Communications (Gigabit Ethernet, Fibre Channel, InfiniBand) Semiconductor Characterization and Validation (PCI-Express, Serial ATA, IEEE 1394, USB 2.0, RAMBUS, DDR) Disk Drive Design Low Input Capacitance: > 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz Small Probe Head Allows Easy Probing of SMDs The Tektronix P7330 Differential Probes enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The Tektronix P7330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
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