Additional Features: Easy to perform in-circuit measurements Excellent frequency response and unity gain High probe sensitivity Low distortion levels Input capacitance (at 500 MHz): < 0.7pF (nominal) Input resistance: 1 MΩ (nominal) Bandwidth: 300 kHz to 3 GHz (nominal) Usable to 100 kHz Average gain: 0 dB ± 1.25 dB Frequency response (relative to Average Gain): 300 kHz to 1 GHz: ±1.25 dB; 1 GHz to 3 GHz: ±2.5 dB Average noise level < 1 mV, 10 Hz to 10 MHz Input voltage for <1 dB compression: 0.3 V Noise figure: Below 100 MHz: < 50 dB; 100 MHz to 3 GHz: < 25 dB Pulse transition time: 200 psec Distortion (at 0.3 V): < –30 dBc Maximum safe input: Probe alone ±1.5 V peak RF, ±50 V DC Probe with 10:1 divider: ±15 V peak RF, ±200 V DC 10:1 divider characteristics: Input capacitance: < 0.7 pF Input resistance: 1 MΩ Input voltage for 1 dB compression: 3 V Power: Supplied by certain Agilent instruments or Agilent 11899A probe power supply: +15 V/130 mA, –12.6 V/45 mA The Agilent HP 85024A has an input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of Agilent HP RF analyzers.